Defects and Diffusion in Semiconductors XII

Erscheinungsjahr 2010
ISBN: 978-3-908451-87-7
Verlag: Trans Tech Publications

Buch, Englisch, 404 Seiten, Format (B × H): 170 mm x 240 mm, Gewicht: 900 g

This twelfth volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective XI (Volume 282). As well as the 565 semiconductor-related abstracts, the issue includes – in line with the policy of including original papers on all of the major material groups.

Autoren/Hrsg.

Fisher, David

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde

Inhaltsverzeichnis

Study of Conduction Mechanism in Amorphous Se85-xTe15Bix Thin Films
Structure and Optical Properties of Magnetron-Sputtered SiOx Layers with Silicon Nanoparticles
Non-Gaussian Diffusion of Phosphorus and Arsenic in Silicon with Local Density Diffusivity Model
Artificial Aging Behavior of 6063 Alloy Studied Using Vickers Hardness and Positron Annihilation Lifetime Techniques
Analysis of the Solid Solution Microstructure of (HF) Al-Zn Alloys
Liquid-Phase Sintering of Tungsten Heavy Alloys
Analysis of Stress Intensity Factor and Crack Propagation for Alloy X-750 Pressure Vessel with a Blunting Crack
Effect of Microstructure upon the Wear Properties of 2.25Cr-1Mo Steel
Phase and Structure Formation of Metallic Materials Electrodeposited via a Liquid State Stage: New Experimental Proof
Testing Natural Aging Effect on Properties of 6066 & 6063 Alloys Using Vickers Hardness and Positron Annihilation Lifetime Techniques
Investigations of the Gyromagnetic Factors for the Ni3+ Center in MgO
Variable Range Hopping (VRH) Model in Manganese Oxides
Theoretical Studies of the EPR Parameters for Rh+ in NaCl
The Effect of Droplet Diameter on the Separation of Heavy-Oil from Water Using a Hydrocyclone
Spreading Exponents: Dynamics of Trisiloxane Wetting of Hydrophobic Surfaces