Advances in Imaging and Electron Physics

Selected Problems of Computational Charged Particle Optics
Erscheinungsjahr 2009
ISBN: 978-0-12-374717-4
Verlag: William Andrew Publishing

Buch, Englisch, 364 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 700 g

Advances in Imaging and Electron Physics merges two long-running serials Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

This monograph summarizes the authors' knowledge and experience acquired over many years in their work on computational charged particle optics. Its main message is that even in this era of powerful computers with a multitude of general-purpose and problem-oriented programs, asymptotic analysis based on perturbation theory remains one of the most effective tools to penetrate deeply into the essence of the problem in question.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Greenfield, Dmitry

Monastyrskii, Mikhael

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

1. Integral equations method in electrostatics2. Surface charge singularities near irregular surface points3. Geometry perturbations4. Some aspects of magnetic field simulation5. Aberration approach and the tau-variation technique6. Space charge in charged particle bunches7. General properties of emission-imaging systems8. Static and time-analyzing image tubes with axial symmetry9. Spatial and temporal focusing of photoelectron bunches in time-dependent electric fields

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.