Advances in Imaging and Electron Physics

Erscheinungsjahr 2004
ISBN: 978-0-12-014773-1
Verlag: William Andrew Publishing

Buch, Englisch, 247 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 550 g

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This book is essential reading for electrical engineers, applied mathematicians and robotics experts.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Autoren/Hrsg.

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik
• Technische Wissenschaften Technik Allgemein Physik, Chemie für Ingenieure
• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Optische Nachrichtentechnik
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Angewandte Optik

Inhaltsverzeichnis

Chapter 1 - Introduction to Hypergraph Theory and Its Use in Engineering and Image Processing (BRETTO)Chapter 2 - Image Segmentation Using the Wigner-Ville Distribution (HORMIGO/CRISTOBAL)Chapter 3 - Statistical and Deterministic Regularities: Utilization of Motion and Grouping in Biological and Artificial Visual Systems (KRUEGER/WORGOTTER)Chapter 4 - The Hopping Electron Cathode for Cathode Ray Tubes (ROSINK et al)

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.