Advances in Imaging and Electron Physics

Erscheinungsjahr 2022
ISBN: 978-0-323-98863-6
Verlag: William Andrew Publishing

Buch, Englisch, 266 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 540 g

Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.

Zielgruppe

<p>Academic, government and industrial sectors</p>

Autoren/Hrsg.

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

Preface Martin Hÿtch and Peter W. Hawkes 1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 2. Development of a global homography-based approach for high-angular resolution in the SEM Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 3. Implementing the homography-based global approach Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 4. Numerical validation and influence of optical distorsions on accuracy Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 5. Applications of the method Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger,Vincent Taupin and Emmanuel Bouzy 6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devices Clifford M. Krowne

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.