Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources

Erscheinungsjahr 2023
ISBN: 978-0-443-19324-8
Verlag: Elsevier Science & Technology

Buch, Englisch, 232 Seiten, Format (B × H): 151 mm x 229 mm, Gewicht: 450 g

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more.

The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Zielgruppe

<p>Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general</p>

Autoren/Hrsg.

Hawkes, Peter W.

Fachgebiete

• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning

Inhaltsverzeichnis

1. Characterization of nanomaterials properties using FE-TEM Florent Houdellier 2. Cold field emission electron source: From higher brightness to ultrafast beam Florent Houdellier 3. Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources Florent Houdellier

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.