Hawkes | The Beginnings of Electron Microscopy - Part 2 | Buch | 978-0-323-98919-0 | sack.de

Buch, Englisch, 544 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 1020 g

Hawkes

The Beginnings of Electron Microscopy - Part 2


Erscheinungsjahr 2022
ISBN: 978-0-323-98919-0
Verlag: William Andrew Publishing

Buch, Englisch, 544 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 1020 g

ISBN: 978-0-323-98919-0
Verlag: William Andrew Publishing


The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917-1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.
Hawkes The Beginnings of Electron Microscopy - Part 2 jetzt bestellen!

Zielgruppe


Academic, government and industrial sectors.


Autoren/Hrsg.


Weitere Infos & Material


Foreword Peter W. Hawkes Foreword to first edition Peter W. Hawkes Preface by Ernst Ruska Ernst Ruska and Peter Hawkes (Afterword) 1. Recollections from the early years: Canada-USA Cecil E. Hall and Peter Hawkes (Afterword) 2. My recollection of the early history of our work on electron optics and the electron microscope Tadatosi Hibi and Peter Hawkes (Afterword) 3. Walter Hoppe-X-ray crystallographer and visionary pioneer in electron microscopy Joachim Frank 4. Reminiscences of the development of electron optics and electron microscope instrumentation in Japan Koichi Kanaya and Peter Hawkes (Afterword) 5. Early electron microscopy in the Netherlands J.B. Le Poole and Pieter Kruit (Afterword) 6. L. L. Marton, 1901-1979 Charles Süsskind and Peter Hawkes (Afterword) 7. The invention of the electron Fresnel interference biprism G. Möllenstedt and Peter Hawkes (Afterword) 8. The industrial development of the electron microscope by the Metropolitan Vickers Electrical Company and AEI Limited T. Mulvey and Peter Hawkes (Afterword)) 9. The development of the scanning electron microscope C.W. Oatley, D. McMullan, K.C.A. Smith, and Peter Hawkes (Afterword) 10. Some recollections of electron microscopy in Britain from 1943 to 1948 R. Reed and Peter Hawkes (Afterword) 11. Rudolf Rühle and the BOSCH electron microscope: another early commercial instrument Hans R. Gelderblom and Heinz Schwarz 12. Otto Scherzer and his contributions to electron microscopy Dieter Typke 13. 1950-1960: a decade from the viewpoint of an applications laboratory Cilly Weichan and Maren Heinzerling (Afterword) 14. From the cathode-ray oscillograph to the high-resolution electron microscope Otto Wolff and Peter Hawkes (Afterword) 15. Reminiscences R.W.G. Wyckoff and Peter Hawkes (Afterword) 16. Complementary accounts of the history of electron microscopy Peter Hawkes


Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.


Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.