Robust Computing with Nano-scale Devices

Progresses and Challenges
2010
ISBN: 978-94-007-3183-7
Verlag: Springer Netherlands

Buch, Englisch, Band 58, 180 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 295 g

Reihe: Lecture Notes in Electrical Engineering

Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.

Zielgruppe

Research

Autoren/Hrsg.

Huang, Chao

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Schaltungsentwurf
• Mathematik | Informatik EDV | Informatik Informatik Rechnerarchitektur
• Technische Wissenschaften Technik Allgemein Modellierung & Simulation
• Technische Wissenschaften Technik Allgemein Nanotechnologie

Inhaltsverzeichnis

Fault Tolerant Nanocomputing.- Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics.- Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays.- Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics.- The Prospect and Challenges of CNFET Based Circuits: A Physical Insight.- Computing with Nanowires: A Self Assembled Neuromorphic Architecture.- Computational Opportunities and CAD for Nanotechnologies.