Buch, Englisch, 281 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 617 g
Algorithms, Systems, and Applications
Buch, Englisch, 281 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 617 g
ISBN: 978-1-4419-7379-5
Verlag: Springer
Zielgruppe
Graduate
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
Optical Devices and Systems.- General Solution of Two-Dimensional Beam-Shaping with Two Surfaces.- Nanophotonics for Information Systems.- Liquid Crystal Light-Valves for Slow-Light and Applications.- Diversity of Optical Signal Processing Led by Optical Signal Form Conversion.- Dynamic Wavefront Sensing and Correction with Low-Cost Twisted Nematic Spatial Light Modulators.- Nanoinjection Detectors and Imagers for Sensitive and Efficient Infrared Detection.- Biological Applications of Stimulated Parametric Emission Microscopy and Stimulated Raman Scattering Microscopy.- 3D Passive/Active Imaging and Visualization.- Novel Approaches in 3D Sensing, Imaging, and Visualization.- Overview of Free-viewpoint TV (FTV).- Presentation and Perception of Digital Hologram Reconstructions of Real-World Objects on Conventional Stereoscopic Displays.- Parallel Phase-Shifting Digital Holography Based on the Fractional Talbot Effect.- Improvement of Viewing-Zone Angle and Image Quality of Digital Holograms.- Shot Noise in Digital Holography.- Deformation of Digital Holograms for Full Control of Focus and for Extending the Depth of Field.- Zoom Algorithms for Digital Holography.- Polarimetric Imaging.- Partial Polarization of Optical Beams: Temporal and Spectral Descriptions.- A Degree of Freedom and Metrics Approach for Nonsingular Mueller Matrices Characterizing Passive Systems.- Resolution-Enhanced Imaging Based upon Spatial Depolarization of Light.- Algorithms for Imaging and Analysis.- Hybrid Imaging Systems for Depth of Focus Extension With or Without Postprocessing.- Multispectral Image Pansharpening Based on the Contourlet Transform.- Faces Robust Image Hashing by ICA: An Attempt to Optimality.- Minkowski Metrics: Its Interaction and Complementarity with Euclidean Metrics.