Buch, Englisch, 240 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 544 g
Contaminant Removal and Monitoring
Buch, Englisch, 240 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 544 g
ISBN: 978-1-4377-7881-6
Verlag: Elsevier Science
In this series, Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and best-practice guidance for scientists and engineers engaged in surface cleaning or dealing with the consequences of surface contamination.
This volume complements Volumes 3 and 4 of this series, which focused largely on particulate contaminants. The expert contributions in this volume cover methods for removal of non-particulate contaminants, such as metallic and non-metallic thin films, hydrocarbons, toxic and hazardous chemicals, and microbiological substances, as well as contamination monitoring in pharmaceutical manufacturing, and an innovative method for characterization at the nanoscale.
Zielgruppe
<p>As a whole, the series will create a unique and comprehensive knowledge base of crucial importance to those in research & development, manufacturing, quality control and procurement specifications in a multitude of industries such as: aerospace, automotive, biomedical, defense, energy, manufacturing, microelectronics, optics and xerography. Researchers in an academic setting will also find these volumes excellent source books. </p>
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
- Surface Contamination Removal Using Dense Phase Fluids: Liquid and Supercritical Carbon Dioxide
- Plasma Cleaning for Electronic, Photonic, Biological and Archeological Applications
- Cleanroom Wipers for Removal of Surface Contamination
- Impact of Microbial Surface Contamination and Effective Environment Monitoring System in Pharmaceutical Manufacturing
- Neutron Holography as a Technique for Probing Local Atomic Structures on the Nanoscale