Logarithmic Image Processing: Theory and Applications

Erscheinungsjahr 2016
ISBN: 978-0-12-804813-9
Verlag: William Andrew Publishing

Buch, Englisch, 282 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 700 g

Logarithmic Image Processing: Theory and Applications, the latest volume in the series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy and features cutting-edge articles on recent developments in all areas of microscopy, digital image processing, and many related subjects in electron physics.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Signalverarbeitung
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning

Inhaltsverzeichnis

1. Gray-Level LIP Model. Notations, Recalls and First Applications2. Various Contrast Concepts3. Metrics Based on Logarithmic Laws4. Dynamic Range Expansion, Night Vision. Stabilization, Centering. Industrial and Biomedical Applications5. Ability of the LIP Model to Simulate Variable Acquisition Conditions6. Transfer of Classical Tools to the LIP Context7. General Conclusion

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.