Parvel / Wu | Advanced Measurement and Test IV | Sonstiges | 978-3-03859-076-7 | sack.de

Sonstiges, Englisch, Band Volume 1083, 230 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g

Reihe: Advanced Materials Research

Parvel / Wu

Advanced Measurement and Test IV


Erscheinungsjahr 2015
ISBN: 978-3-03859-076-7
Verlag: Trans Tech Publications

Sonstiges, Englisch, Band Volume 1083, 230 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g

Reihe: Advanced Materials Research

ISBN: 978-3-03859-076-7
Verlag: Trans Tech Publications


Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China.
The 37 papers are grouped as follows:
Chapter 1: Materials Science;
Chapter 2: Material Processing and Testing Technology;
Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies
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Autoren/Hrsg.


Weitere Infos & Material


Adsorption of the Polyvinylidene Fluoride-Based Metal Affinity Membrane towards Bovine Serum AlbuminMonomer Reactivity Ratios and Chain Segment Distribution for AM/2-EHA CopolymerThe Preparation and Characterization of AM/2-EHA Copolymer as Profile Control AgentThe Domain Dynamic in Fe-Based Amorphous Alloy Ribbons by Means Inductance Spectroscopy
In
Vitro Antitumor Efficacy of Puerarin Nanosuspension against Human HepG2 CellsDependence of Granular Matrix Demagnetizing Factor on the Matrix Relative SizeStudy on Microstructure and Phase Composition of Co-8.8Al-9.8W Superalloy with Alloying Element TantalumWater-Resistance Material from Fibers and Acrylic Emulsion TerpolymerQuercetin Molecularly Imprinted Polymers and its Application in the Separation and Analysis of Natural ProductsFast and Efficient Synthesis of Mono-(6-p-toluenesulfonyl)-?-cyclodextrin via Ultrasound Assisted MethodStudy on Phase Stability of Hexagonal Ba(Ti0.95Fe0.05)O3-d Ceramic via Temperature-Dependent X-Ray DiffractionThe Experiment Research on Storage Characteristic of Multiple Melting Point PCMSurface Modification of SKD 61 by Electrical Discharge Coating (EDM/EDC) with Multilayer Rectangular Cross-Section Electrode and Jatropha curcas as Dielectric FluidThe Regular Pattern of Demagnetizing Factor Behaviour of Various ?Cores? of Granule-Ball ChainsDetermination of Nitrophenol Isomers in WaterRP-HPLC-UV Method for Simultaneous Determination of Isoflavonoids in Huangqi Gegen and its Markted FormulationsGFRP Bar: Determining Tensile Strength with Bending TestResearch on Parameter Optimization of Mixed Gas IR SVM Calibration ModelMeasurement of Thermo-Radiation Characteristics of IR Window MaterialsAccurate Measurement on Cross Sectional Area of Single Filaments Using a Desktop SEMA Research on High-Precision Strain Measurement Based on FBG with Temperature CompensationDevelopment of Temperature and Magnetic Field Monitoring System of ITER HTS MagnetSurface Condensation Assessment Using Probabilistic CalculationComparison of Optical and Scintillation Images Obtained by Using a Fiber-Optic Beta/Gamma Imaging DetectorStereo Image Matching Based on SURF DescriptorA Method of Experimental Design for GNSS-Dot Net under Jamming AttackA New Model to Accelerate Data CollectionFrequency Measurement and Analysis on Liquid-Filled Pipe Based on Fiber Bragg Grating SensorSimulation Analysis of the Multi-Parameter Influence on FBG Peak ReflectivityInfluence of Transformer Rated Secondary Load Differences on Electric Energy MeteringTesting Level Measurement Devices by Imitating Sensor SignalsIV-Characteristics Measurement Error Resulting from Long Cables for Irradiated Bipolar Junction TransistorsNumerical Simulation of Oblique Towing Tests and Rotating Arm Tests for a Submarine Model in Same Grid TopologyA New Test Environment Approach to SEE Detection in MOSFETsProposal of Software Solution to Distant Access of the Alarm Registration Centre to Technical EquipmentDual-Sequenced Real Coded Genetic Algorithm for Picking Process OptimizationAn Automatic Equipment for Measure of Electrical Characteristics of Nanoelectronic Devices


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