E-Book, Englisch, Band 892, 722 Seiten, eBook
Rajaram / Balamurugan / Gracia Nirmala Rani VLSI Design and Test
Erscheinungsjahr 2019
ISBN: 978-981-13-5950-7
Verlag: Springer Singapore
Format: PDF
Kopierschutz: 1 - PDF Watermark
22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
E-Book, Englisch, Band 892, 722 Seiten, eBook
Reihe: Communications in Computer and Information Science
ISBN: 978-981-13-5950-7
Verlag: Springer Singapore
Format: PDF
Kopierschutz: 1 - PDF Watermark
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Digital design.- Analog and mixed signal design.- Hardware security.- Micro bio-fluidics.- VLSI testing.- Analog circuits and devices.- Network-on-chip.- Memory.- Quantum computing and NoC.- Sensors and interfaces.
