E-Book, Englisch, Band 318, 566 Seiten, eBook
Reihe: NATO Science Series E
Roozeboom Advances in Rapid Thermal and Integrated Processing
Erscheinungsjahr 2013
ISBN: 978-94-015-8711-2
Verlag: Springer Netherland
Format: PDF
Kopierschutz: 1 - PDF Watermark
E-Book, Englisch, Band 318, 566 Seiten, eBook
Reihe: NATO Science Series E
ISBN: 978-94-015-8711-2
Verlag: Springer Netherland
Format: PDF
Kopierschutz: 1 - PDF Watermark
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
1. Introduction: history and perspectives of Rapid Thermal Processing.- 2. The thermal radiative properties of semiconductors.- 3. Wafer temperature measurement in RTP.- 4. Wafer emissivity in RTP.- 5. Temperature and process control in Rapid Thermal Processing.- 6. Single-wafer process integration and process control techniques.- 7. Rapid Thermal O2-oxidation and N2O-oxynitridation.- 8. Integrated pre-gate dielectric cleaning and surface preparation.- 9. Dielectric photoformation on Si and SiGe.- 10. Modeling strategies for Rapid Thermal Processing: finite element and Monte Carlo methods.- 11. Modeling approaches for Rapid Thermal Chemical Vapor Deposition: combining transport phenomena with chemical kinetics.- 12. Silicidation and metallization issues using Rapid Thermal Processing.- 13. Rapid Thermal Multiprocessing for a programmable factory for manufacturing of ICs.- 14. RTCVD integrated processing for photovoltaic application.- 15. Equipment design, cluster tools and scale-up issues.- 16. Rapid Thermal Chemical Vapor Deposition of epitaxial Si and SiGe.- 17. The evolving role of Rapid Thermal Processing for deep submicron devices.- 18. Rapid Thermal Processing of contacts and buffer layers for compound semiconductor device technology.- 19. Rapid Thermal Processing of magnetic thin films for data storage devices.- Appendix List of ASI participants.