Buch, Englisch, 444 Seiten, Format (B × H): 155 mm x 231 mm, Gewicht: 839 g
Modern Experimental Techniques
Buch, Englisch, 444 Seiten, Format (B × H): 155 mm x 231 mm, Gewicht: 839 g
ISBN: 978-981-4303-59-0
Verlag: Jenny Stanford Publishing
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
Zielgruppe
Academic and Postgraduate
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
An Overview of X-Ray Scattering and Diffraction Theory and Techniques. Scattering and Diffraction Beamlines at Synchrotron Radiation Sources. Micro- and Nano-diffraction. Small-Angle X-Ray Scattering. The X-Ray Standing Wave Technique: Fourier Analysis with Chemical Sensitivity,. Inelastic X-Ray Scattering from Phonons. Magnetic X-Ray Scattering. Nuclear Resonant Scattering of Synchrotron Radiation: Applications in Magnetism. X-Ray Diffraction at Extreme Conditions: Today and Tomorrow. Synchrotron Tomography. Coherent X-Ray Diffraction Imaging of Nanostructures. X-Ray Photon Correlation Spectroscopy.