Seeck / Murphy X-Ray Diffraction

Modern Experimental Techniques
Erscheinungsjahr 2015
ISBN: 978-981-4303-60-6
Verlag: Pan Stanford Publishing
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 414 Seiten

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

Zielgruppe

Materials scientists working with synchrotron radiation sources as well as graduate students and scientists involved in x-ray experiments at these sources.

Autoren/Hrsg.

Seeck, Oliver H.

Murphy, Bridget

Fachgebiete

• Technische Wissenschaften Verfahrenstechnik | Chemieingenieurwesen | Biotechnologie Verfahrenstechnik, Chemieingenieurwesen
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Lasertechnologie, Holographie
• Technische Wissenschaften Technik Allgemein Technische Optik, Lasertechnologie

Inhaltsverzeichnis

An Overview of X-Ray Scattering and Diffraction Theory and Techniques, Oliver H. Seeck
Scattering and Diffraction Beamlines at Synchrotron Radiation Sources, Oliver H. Seeck
Micro- and Nano-diffraction, Christina Krywka and Martin Mueller
Small-Angle X-Ray Scattering, Ulla Vainio
The X-Ray Standing Wave Technique: Fourier Analysis with Chemical Sensitivity, Jörg Zegenhagen
Inelastic X-Ray Scattering from Phonons, Alexej Bosak and Michael Krisch
Magnetic X-Ray Scattering, Steve Collins
Nuclear Resonant Scattering of Synchrotron Radiation: Applications in Magnetism, Ralf Röhlsberger
Reflectivity at Liquid Interfaces, Bridget M. Murphy
X-Ray Diffraction at Extreme Conditions: Today and Tomorrow, Hanns-Peter Liermann
Synchrotron Tomography, Astrid Haibel
Coherent X-Ray Diffraction Imaging of Nanostructures, Ivan Vartanyants and Oleksandr Yefanov
X-Ray Photon Correlation Spectroscopy, Christian Gutt and Michael Sprung

Über Autor(innen)

Oliver H. Seeck graduated from the University of Kiel (Germany), studying the structure of thin layers and surfaces. He continued this research as post-doc at the Advanced Photon Source in Chicago. Thereafter, he worked as a scientist at Forschungszentrum Jülich, managing a diffraction beamline at DESY, Germany, and became a DESY faculty member in 2005. Until spring 2014, Seeck was responsible for the diffraction beamline P08 at the third-generation synchrotron radiation source PETRA III. He now heads the PETRA III experiments division.

Bridget M. Murphy moved to Daresbury Synchrotron Radiation Source (CCLRC) in the UK upon completing her master’s at Dublin City University in Ireland. Working there as a beamline scientist, she specialized in x-ray scattering techniques. She moved to the University of Kiel to research phase transitions in strongly correlated systems and obtained her PhD in 2004. She continued to develop x-ray methods and investigating structure and dynamics of solid and liquid interfaces. At present, she is a faculty member at the University of Kiel.