Speckle Metrology

1. Auflage 1993
ISBN: 978-0-8247-8932-9
Verlag: CRC Press

Buch, Englisch, 572 Seiten, Format (B × H): 161 mm x 240 mm, Gewicht: 1016 g

Reihe: Optical Science and Engineering

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

Autoren/Hrsg.

Sirohi

Sirohi, R.S.

Fachgebiete

• Technische Wissenschaften Technik Allgemein Mess- und Automatisierungstechnik
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Angewandte Optik
• Naturwissenschaften Physik Elektromagnetismus Optik

Inhaltsverzeichnis

Theory and applications of speckle displacement and decorrelation, I. Yamaguchi; techniques of displacement and deformation measurements in speckle metrology, Pramod K. Rastogi; speckle methods in experimental mechanics, Rajpal S. Sirohi; recent developments in video speckle interferometry, Ole J. Lokberg; novel applications of speckle metrology, Chandra S. Vikram; particle image velocimetry (PIV), K.D. Hinsch; white light speckle metrology, Anand K. Asundi; surface roughness evaluation, J.D. Briers; automatic fringe analysis procedures in speckle metrology, G.H. Kaufmann; speckle metrology using hololenses, Chandra Shahker; correlation speckle interferometry in the mechanics of contact interaction, Yu I. Ostrovsky and V.P. Shchepinov.

Über Autor(innen)

R. S Sirohi (Author)