Preisanfrage zu Produkt "Advanced Measurement and Test IV"


  • Parvel / Wu Advanced Measurement and Test IV

    Selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China
    ISBN: 978-3-03835-374-4
    Medium: Buch
    Verfügbarkeit: Lieferfrist: bis zu 10 Tage