Sonstiges, Englisch, 528 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g
Sonstiges, Englisch, 528 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g
ISBN: 978-0-87849-171-1
Verlag: Trans Tech Publications
Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.
Autoren/Hrsg.
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Weitere Infos & Material
1.1 Characterization of Crystalline Materials with Powder X-Ray Diffraction (XRD)1.2 Study of Nuclear (Chemical) and Magnetic Structures Using Neutron Scattering1.3 Use of SANS and SAXS in Studying Nanoparticles2.1 IR Spectroscopy: Applications in Material Characterization2.2 Raman Spectroscopic Technique for Materials Characterization2.3 Structural Aspects of Zeolites and Oxide Glasses: Insights from Solid State Nuclear Magnetic Resonance2.4 Electron Paramagnetic Resonance (EPR) Spectroscopy in Material Characterization2.5 Positron Annihilation Spectroscopy2.6 M?ssbauer Spectroscopy and its Applications3.1 Mass Spectrometry for Characterization of Materials3.2 Neutron Activation Analysis and Applications3.3 Atomic Absorption, Emission and Mass Quantification in the Elemental Characterization of Materials3.4 Microanalysis by Electron Beam3.5 Compositional Characterization of Surfaces with Ion Beam Analysis4.1 Synchrotron Radiation and its Application for Material Characterization4.2 Materials Characterization Using Surface Analytical Techniques: X-ray Photoelectron Spectroscopy5.1 Atomic Force Microscope (AFM) in Chemistry, Biology and Material Science5.2 Particle Characterization by Light Scattering5.3 Characterization of Nanostructures by Transmission Electron Microscopy5.4 Principles and Applications of SEM and EDAX
