Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings
1. Auflage 2006
ISBN: 978-3-540-37236-3
Verlag: Springer

Buch, Englisch, 939 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 1431 g

Reihe: Image Processing, Computer Vision, Pattern Recognition, and Graphics

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.

Zielgruppe

Research

Autoren/Hrsg.

Yeung, Dit-Yan

Kwok, James T.

Fred, Ana

Roli, Fabio

de Ridder, Dick

Fachgebiete

• Mathematik | Informatik EDV | Informatik Programmierung | Softwareentwicklung Grafikprogrammierung
• Mathematik | Informatik EDV | Informatik Informatik Künstliche Intelligenz Mustererkennung, Biometrik
• Mathematik | Informatik EDV | Informatik Informatik Künstliche Intelligenz Wissensbasierte Systeme, Expertensysteme
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Robotik
• Mathematik | Informatik EDV | Informatik Programmierung | Softwareentwicklung Spiele-Programmierung, Rendering, Animation

Inhaltsverzeichnis

Invited Talks.- SSPR.- Poster Papers.- SPR.- Poster Papers.