Yoshinaga / Watanabe / Takahashi | Grain Growth in Polycrystalline Materials II | Sonstiges | 978-3-03859-820-6 | sack.de

Sonstiges, Englisch, 820 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g

Yoshinaga / Watanabe / Takahashi

Grain Growth in Polycrystalline Materials II


Erscheinungsjahr 1996
ISBN: 978-3-03859-820-6
Verlag: Trans Tech Publications

Sonstiges, Englisch, 820 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g

ISBN: 978-3-03859-820-6
Verlag: Trans Tech Publications


Grain Growth is one of the most fundamental microstructural changes, and occurs in all types of polycrystalline material. It is of major scientific interest, and of great importance in a wide range of industrial applications.
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Weitere Infos & Material


Analytical Treatments of Normal Grain GrowthStatistical Theory of Grain Growth and Its Topological FoundationsSolute Effects on the Structural and Migration Behaviour of Grain BoundariesHigh Pressure Effects on Grain Boundary Migration and Mechanism of Grain Boundary MigrationStatistical Theory of Grain Growth: A Generel ApproachComputer Simulation of Two-Dimensional Grain Growth with Anisotropic Grain Boundary Energy and Mobility by Vertex ModelGrain Growth and Texture Evolution in Thin FilmsIn-Situ Observations of Grain Boundary MigrationGrain Growth in CeramicsTexture in 3% Si-Fe Ribbon Cast DirectlyFactors Affecting Grain Growth of Very Thin Silicon Steel SheetsRecent Development of Technology of Grain Oriented Silicon SteelModelling the Effects of Nucleation and Growth on Texture Formation in Commercial SteelsGrain Growth Control by Solidification TechnologyOrientation Imaging Microscopy: Bridging the Grain-Boundary Structure-Properties Linkage in Polycrystalline MaterialsChemically Induced Interface MigrationGrain Boundary Structure and Growth Sequence of Diamond Thin FilmPhase Boundary Migration Due to InterdiffusionGrain Boundary Migration in Fe-3%Si BicrystalComputer Simulation of Grain Boundary in BCC Fe by Embedded Atom MethodMonte Carlo Simulation of Interactions between Grain Boundary Migration and PrecipitationCorrelation of Grain Boundary Energy with Boundary Dislocation DensityMolecular Dynamics Simulations of the Melting of a Twist S=5 Grain BoundarySome Theoretical Considerations on Abnormal Grain GrowthPhysical Aspects of Grain Growth PhenomenaThree-Dimensional Computer Modeling of Grain Growth: A Vertex model ApproachQuantitative Analysis of DIGM in Binary Sytems Using a Model of Driving Energy for AlloyingSimulation of Normal Grain Growth by the 3-D Statistical ModelNormal and Abnormal Grain Growth and Particularly the Behaviour of Large and Small Grains as Predicted by Simulations on the Basis of the Statistical ModelA Study on Three Dimensional Monte Carlo Method for Grain Growth SimulationThe Influence of Anisotropy on the Recrystallization KineticsComputer Simulation of Grain Growth in Particle Dispersed StructureComputer Simulation of Grain Growth Induced by Superplastic DeformationScaling Behavior in Grain Growth3-D Anisotropic Grain Growth First Simulation Results with a Laguerre ModelA Mathematical Model for the Solute Drag Effect on RecrystallizationModelling of the Texture Evolution during ElectrodepositionRate Equation for Grain Growth with Two-Sphere ModelGrain Rotation and Microstructure Development in Thin Films of GoldThe Role of Anisotropic Grain Boundary Parameters in Grain GrowthFormation of (111) Recrystallization Texture in Al-Mg AlloysDeformation, Recrystallization and Premelting in BicrystalsGrain Growth and the Processing of Nanocrystalline CeramicsFormation of Slip Traces during Grain Growth of Thin Metal SheetsGrain Size Control in Foil-Metallurgical Processing of Aluminium AlloyAbnormal Growth of Facted Grains in Liquid MatrixChange in Boundary Misorientation with Subgrain Growth in a Microduplex Stainless SteelThe Influence of Texture and Grain Boundary Character Distribution on the Reliability of Aluminium Thin FilmsStructural Evolution and Validity of Hall-Petch Relationship in an Al-3% Mg Alloy with Submicron Grain SizeHigh-Resolution Electron Microscopy Observations of Grain Boundary Structures in Submicrometer-Grained Al-Mg AlloysThe Role of Texture-Related Mobility in the Secondary Recrystallization of ODS AlloysComputer-Aided Investigation of Isothermal Grain Growth in Copper and BrassGrain Boundary Design for Electrical and Magnetic Properties of Thin Film through Abnormal Grain GrowthGrain Rotation during Grain Growth of Polycrystalline AluminiumMicrostructure Change and Precipitation Behavior during Hot Deformation in Al-5.5Mass%Mg AlloysGrain Growth Process in Al-0.3Mass%Mg AlloyGrain Size Dependence on the Dynamic Characteristics in a Mechanically Alloyed IN905XL AlloyAbnormal Grain Growth in AluminaAbnormal Grain Growth of BaTiO3 with Small Cation NonstoichiometryTexture Development in Oxides Modified with Reactive Element AdditionThe Influence of Annealing on Grain Growth in Nanocrystalline CeO2 CeramicsGrain Growth and Texture of Chemical-Vapour-Deposited Refractory Metal and CeramicGrain Growth Behavior of Fine-Grained Silicon Nitride CeramicsTopological Relationships Valid in Grain Growth Microstructure of Fe3%SiTexture Change during Primary Recrystallized Grain Growth in Fe-3%Si AlloyGrain Growth Behavior during Static Recrystallization of 3%-Silicon Steel Following High Temperature DeformationEffect of Sn on Primary Recrystallization Texture of Fe-Si AlloyThe Research on Fine-Grained Cube Texture; A Soft Magnetic Material for Use in High Frequency Electronic FieldsA New Texture Control Process for Grain Oriented Si SteelTexture Selection by Secondary Recrystallization in Grain Oriented Silicon Iron: Competitive Texture Components for Goss GrainsMicrostructures in Secondary Recrystallized {100} Grains of 3%Si-FeSecondary Recrystallization in Fe-3.3 Mass % Si Re-Rolled FoilEffect of Hot-Band Annealing Condition on Secondary Recrystallization of Ultra-Low Carbon 2.3%Si-1.7%Mn SteelPrecipitation Behaviors of Injected Nitride Inhibitors during Secondary Recrystallization Annealing in Grain Oriented Silicon SteelInfluence of Inhibitor Intensity on Secondary Recrystallization in Fe-3%Si AlloyInfluence of Secondary Recrystallization Temperature on Secondary Recrystallization Texture in Fe-3%Si AlloyComputer Simulation of the Influence of Inhibitor Intensity on Secondary Recrystallization in Fe-3%Si AlloyEffect of Cold Rolling Reduction on Secondary Recrystallization of 3%Si-FeInfluence of primary Recrystallized Structure on Secondary Recrystallization in Fe-3%Si AlloyPrediction Method of Sharpness of {110} Secondary Recrystallization Texture of Fe-3%Si AlloyRelationship between Primary Recrystallized Structure with Texture and Secondary Recrystallization Kinetics of Fe-3%Si AlloysInfluences of Tin and Copper on the Inhibitor Intensities in High-Induction Grain-Oriented Silicon SteelSecondary Grain Growth Behavior of Refractory MetalsThe Control of Grain Size Particles in Grain Boundary for Superplastic Aluminium AlloysRole of CSL Boundaries during the Recrystallization of a IF SteelInfluence of Precipitates on Behavior of Recrystallization and Grain Growth in Extra Low Carbon Ti-Bearing Cold-Rolled Steel SheetsA Study of the Relation between Distribution of Grain Diameters and Metallurgical Properties in Recrystallized Steel SheetAbnormal Grain Growth in Ti- and Zr-Containing Hot Rolled Electrical SteelsThe Effect of Nb on Texture Formation and Formability of Cold-Rolled Rephosphorized Sheet SteelRelationship between Structural and Physical Properties in Hexagonal Boron Nitride CeramicsThe Microstructural Evolutions during Growth of Zn-Fe Electrodeposits on Steel SubstrateFractal Dimension of Zirkonia Grain in Alumina/Zirconia Ceramic CompositesEBSP Studies of Growth Rates during RecrystallizationObservation of the Growth of Secondary Recrystallization Grains in Grain-Oriented Electrical Steel by New Ultrasonic Wave MethodAtomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide FilmsAn Experimental Investigation of Grain Boundary Structure Effects on Grain GrowthX-Ray Diffraction Measurments of Grain Size as a Function of Orientation in Primary Recrystallized Silicon-IronIn Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of SemiconductorsAnalyzing Method of Surface Structures by X-Ray Photoelectron Spectroscopy (XPS)


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