Means and Methods for Measurement and Monitoring

Supplement Book to Advanced Micro-Device Engineering VIII
Erscheinungsjahr 2019
ISBN: 978-3-0357-1553-8
Verlag: Trans Tech Publications

Buch, Englisch, 108 Seiten, Format (B × H): 170 mm x 240 mm, Gewicht: 330 g

This special issue is the supplement book of proceedings of the 8th International Conference on Advanced Micro-Device Engineering (AMDE 2016) organized by the Human Resource Cultivation Center, Gunma University, held on 9 December 2016 in Kiryu, Japan. Thematic area of this volume is "Measurement and System technology"

Autoren/Hrsg.

Hanaizumi, Osamu

Fachgebiete

• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Medizintechnik, Biomedizintechnik
• Medizin | Veterinärmedizin Medizin | Public Health | Pharmazie | Zahnmedizin Medizin, Gesundheitswesen Medizintechnik, Biomedizintechnik, Medizinische Werkstoffe
• Technische Wissenschaften Technik Allgemein Mess- und Automatisierungstechnik

Inhaltsverzeichnis

Preface
Analysis and Design of Operational Amplifier Stability Using Routh-Hurwitz Stability Criterion
Effect of Phase Error in Phase-Shifting Interferometer
Comparator Synthesis Using Distributed Genetic Algorithm and HSPICE Optimization
RC Polyphase Filter as Complex Analog Hilbert Filter
Rehabilitation Assistance Using Motion Capture Devices and Virtual Reality Feedback
Determination of Phase Shift by Digital Holography
Noise Filter for Surface Shape Measurement in Digital Holography
High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform Generator
Multi-Valued PAM-N Data Transmission Using Double-Rate Tomlinson-Harashima Precoding
A Torque-Sensorless Viscometer for Food Processing Applications
Effect of Mass Added to a Force Transducer on the Dynamic-Force Correction Method
Another Implementation of Efficient Recoding Circuit for Signed Digit to Residue Canonical Signed Digit on Modulo 2n-1
Electron Density Measurement Using Multi-Energy X-Rays from a Conventional Laboratory X-Ray Source
A Study on Physically Based Maximum Electric Field Modeling Used for HCI Induced Degradation Characteristic of LDMOS

Über Autor(innen)

Ed. Osamu Hanaizumi